Date: November 20, 2014
Time: 4:30 pm - 6:00 pm
Location: Friend 008
Dr. Robert Winarski, of Argonne National Laboratory, presents “So you want to see inside…Nanoscale x-ray microscopy methods for materials studies” on Thursday, November 20, 2014 in Friend 008.
ABSTRACT:
X-ray imaging techniques are being developed to visualize in-situ and in-operando behavior of materials. These new capabilities allow us to visualize changes in systems in real time using the brightness provided by the Hard X-ray Nanoprobe Beamline, with image resolutions better than thirty nanometers [1,2]. We have developed techniques to image structural and elemental changes in a wide variety of materials including battery electrodes, advanced cement composites, and electronic junctions [3-5]. In this presentation, I will be discussing the techniques that we have developed for exploring system dynamics, and some of the new knowledge that we have gained from being able to see what is really happening inside these evolving materials.
BIOGRAPHY:
Robert Winarski received his PhD in Physics from Tulane University in 1999. He was responsible for the design and construction of Argonne National Laboratory’s X–ray Nanoprobe Beamline Project ($13 million). He conceived of and implemented innovative synchrotron radiation experiments and techniques specifically related to the Nanoprobe. Robert is a scientist in the X–ray Microscopy Group at the Center for Nanoscale Materials and is the leader of the nanotomography program at the Hard X–ray Nanoprobe Beamline (Sector 26). The Hard X–ray Nanoprobe combines tomography, fluorescence mapping, and diffraction measurements in a single instrument with a spatial resolution of tens of nanometers for objects measuring up to tens of microns. The penetrating power available at these length scales at this hard X–ray beamline allows for examinations of subsurface features not visible using electron imaging methods. Robert has developed imaging capabilities for measuring structural changes to samples in operando.